High performance benchtop EDXRF spectrometer with Windows® software
High resolution elemental analysis of Na through U
NEX QC+ QuantEZ
As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
Elemental analysis in the field, plant or lab
Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX QC+ QuantEZ series add to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX QC QuantEZ series is the reliable choice for routine elemental analysis.
50kV X-ray tube and SDD detector
The shuttered 50kV X-ray tube and Peltier cooled Silicon Drift Detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
- Analyze ₁₁Na to ₉₂U non-destructively
- Powerful QuantEZ Windows®-based software
- Solids, liquids, alloys, powders and thin films
- 50kV X-ray tube for wide elemental coverage
- SDD detector for superior resolution
- Multiple automated tube filters for enhanced sensitivity
- Unmatched performance-to-price ratio
- Optional RPF-SQX fundamental parameters software
Options: autosampler, helium and FP
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.