Rigaku ART – Guill-Bern Corporation

NEX QC Series

admin-gbc — Wed, 26 Feb 2025 03:42:56 +0000

The Rigaku NEX QC Series energy dispersive X-ray fluorescence (EDXRF) spectrometers offer a
cost-effective solution that makes elemental analysis accessible for any lab or facility. These
instruments provide rapid results and are easy to operate, even for non-technical personnel.
Models include NEX QC, NEX QC+, and NEX QC+ QuantEZ.

NEX QC
The Rigaku NEX QC provides non-destructive analyses of sodium to uranium in almost any sample
type. Its small footprint, touchscreen operation, and built-in printer make it perfect for settings
where space is limited or for on-site testing.
This system is a cost-effective solution and does not require an external computer. Its touchscreen
uses an intuitive icon-driven interface, guiding users through analysis operations. This ease of use
brings effortless elemental analysis capabilities to any lab, plant floor, or field environment.
The NEX QC is designed for routine quality control (QC) applications and can withstand industrial
environments. Like Rigaku’s high-end EDXRF systems, NEX QC is assembled with durable materials
and made to last. It has a 50 kV X-ray tube, a solid-state detector, and automated tube filters. The
NEX QC is built with high-precision components, engineered to deliver excellent performance and
reliability.

NEX QC+
For more demanding applications or for situations where analysis time or sample throughput is
critical, the Rigaku NEX QC+ is offered. This system is based on the NEX QC instrument and has all
the same features and options. The key difference between the models is that the NEX QC+ is
configured with a high-performance silicon drift detector (SDD), giving enhanced peak resolution
and counting statistics, as well as reduced measurement times. As a result, users get improved
calibrations and precision.

NEX QC and NEX QC+ – Key Advantages and Features
• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Affordable EDXRF for routine measurements and basic QC purposes
• Solids, liquids, alloys, powders and thin films
• Lightweight, small footprint, and does not require an external PC
• Icon-driven touchscreen interface and built-in printer
• 50 kV X-ray tube for wide elemental coverage
• High-performance semiconductor detector
• Multiple automated tube filters for enhanced sensitivity

NEX QC and NEX QC+ – Specifications
Technique: Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit: Combines performance and affordability; elemental analysis of solids, liquids,
powders, alloys, and thin films
Technology: EDXRF using a high-performance Si-PIN diode detector (NEX QC model) or high
performance silicon drift detector (NEX QC+ model)
Attributes: 50 kV 4 W X-ray tube, high-performance semiconductor detector, embedded
computer, icon-driven graphical user interface, built-in printer, USB and Ethernet
connections, analyze Na to U
Options: Helium purge, automatic sample changers, single-position sample spinner, UPS,
portable carrying case
Dimensions
Mass: 31 (W) x 376 (H) x 432 (D) mm
Approx. 16 kg
Power requirements: 1Ø, 100 – 240 V, 1.4 A (50/60 Hz)

NEX QC+ QuantEZ
The Rigaku NEX QC+ QuantEZ system is NEX QC+ at its core but packaged with powerful QuantEZ
software operating from an external PC. This instrument provides easy operation with a simple
menu navigation and a customizable EZ Analysis screen. This screen’s flow bar wizard gives a step
by-step setup, walking users through creating their own methods.
Compared to the NEX QC and NEX QC+ models, NEX QC+ QuantEZ expands the analytical
capabilities and range of applications with the availability of RPF-SQX Fundamental Parameters.
This software option reduces the need for standards, which can be expensive and difficult to obtain
for many applications. Additional software options are also available, including SureDI, supporting
compliance with 21 CFR Part 11. This option allows organizations in regulated industries, such as
pharmaceuticals, to meet FDA requirements confidently.

NEX QC+ QuantEZ – Key Advantages and Features
• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• Solids, liquids, alloys, powders and thin films
• 50 kV X-ray tube for wide elemental coverage
• Silicon drift detector (SDD) for superior resolution
• Multiple automated tube filters for enhanced sensitivity
• Unmatched performance-to-price ratio
• Advanced RPF-SQX Fundamental Parameters software
• SureDI support for 21 CFR Part 11 compliance

NEX QC+ QuantEZ – Specifications
Technique: Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit: Features QuantEZ for increased analytical capabilities; elemental analysis of solids,
liquids, powders, alloys, and thin films
Technology: Energy dispersive XRF (EDXRF) using high-performance silicon drift detector (SDD)
Attributes: 50 kV 4 W X-ray tube with automated tube filters, high-performance SDD, analyze
Na to U
Software: QuantEZ for control of spectrometer functions and data analysis
Options: Helium purge, automatic sample changers, single-position sample spinner, external
PC with Microsoft Windows operating system, UPS, RPF-SQX Fundamental
Parameters, SureDI support for 21 CFR Part 11 compliance, other software features
Dimensions: 331 (W) x 232 (H) x 432 (D) mm
Mass: Approx. 16 kg
Power requirements: 1Ø, 100 – 240 V, 1.4 A (50/60 Hz)

NEX DE Series

admin-gbc — Wed, 26 Feb 2025 03:38:49 +0000

The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray
fluorescence (EDXRF) spectrometers. These instruments provide rapid, non-destructive elemental
analysis of sodium to uranium in almost any sample type.
NEX DE Series spectrometers have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a
high-throughput silicon drift detector (SDD) that supports count rates over 500K cps. The high
count rates deliver low limits of detection and provide excellent spectral resolution. Combined with
the powerful QuantEZ software, these features provide unparalleled performance.
For applications requiring small spot analysis, the NEX DE VS model offers a high-resolution
camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3
mm, and 10 mm spot sizes.
Whether the need is basic quality control (QC) or its more sophisticated variants such as analytical
quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma — NEX DE
Series spectrometers deliver quick, high-performance results without complex setups.
Models include NEX DE and NEX DE VS.

NEX DE Series – Key Advantages and Features
• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Solids, liquids, alloys, powders and thin films
• High-performance SDD for superior data
• Unmatched performance-to-price ratio
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• 60 kV X-ray tube for wide elemental coverage
• Multiple automated tube filters for enhanced sensitivity
• Advanced RPF-SQX Fundamental Parameters software featuring Rigaku Scattering FP
• SureDI support for 21 CFR Part 11 compliance
• High-res camera and automated collimators for accurate sample positioning (NEX DE VS)
• Analyze 1 mm, 3 mm, and 10 mm spot sizes (NEX DE VS)

NEX DE Series – Specifications
Technique: Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit:High-performance results when analysis time or sample throughput is critical; analyze solids, liquids, powders, coatings, and thin films
Integrated camera and small spot analysis (NEX DE VS model)
Technology: Energy dispersive XRF (EDXRF) using high-performance silicon drift detector (SDD)
Attributes: 60 kV 12 W X-ray tube with automated tube filters, high-performance SDD, analyze
Na to U
Software: QuantEZ for control of spectrometer functions and data analysis
Options: Vacuum (NEX DE model), helium purge, automatic sample changers, single
position sample spinner, external PC with Microsoft® Windows® operating system,
UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support
for 21 CFR Part 11 compliance, other software features
Dimensions: 356 (W) x 260 (H) x 351 (D) mm
Mass: Approx. 27 kg (core unit)
Power requirements: 1Ø, 100 – 240 V, 1.5 A (50/60 Hz)

NEX CG II Series

admin-gbc — Wed, 28 Aug 2024 01:21:34 +0000

The Rigaku NEX CG II Series are powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers. They perform rapid qualitative and quantitative elemental
analyses and address needs across many industries. NEX CG II Series spectrometers serve a broad
range of applications and are ideal for measuring ultra-low and trace element concentrations up to
percent levels.
Unlike conventional EDXRF spectrometers, NEX CG II Series are indirect excitation systems using
secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary
targets vastly improves detection limits for elements in highly scattering matrices like water,
hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry
eliminates background noise. As a result, the NEX CG II Series spectrometers bring a new level of
analytical sensitivity to XRF technology. Users can measure ultra-low and trace element
concentrations, even in challenging sample types.
Models include NEX CG II for excellent spectral resolution for trace peaks or NEX CG II+ for more
demanding applications requiring a higher-powered system.

NEX CG II Series spectrometers are well suited for the following applications:
• Agricultural soil and plant materials
• Finished animal feeds
• Waste oils
• Environmental monitoring
• Pharmaceuticals and cosmetics
• Catalysts
• Monitoring for toxic metals in aerosols on air filters
• Trace heavy metals and rare earth elements (REE)
• Other applications that require a high degree of sensitivity

NEX CG II Series – Key Advantages and Features
• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Quick elemental analyses of solids, liquids, powders, coatings, and thin films
• Indirect excitation for exceptionally low detection limits
• High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
• Large-area high-throughput silicon drift detector (SDD)
• Analysis in air, helium, or vacuum
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
• Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
• SureDI support for 21 CFR Part 11 compliance
• Various automatic sample changers accommodating up to 52 mm samples
• Low cost of ownership

NEX CG II Series – Specifications
Technique: Indirect excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit: Excel in complex applications with trace elements and variable base matrices;
analyze solids, liquids, powders, coatings, and thin films
Technology: 3D Cartesian geometry energy dispersive XRF (EDXRF) using a large-area high
throughput silicon drift detector (SDD)
Attributes: High-power X-ray tube (50 kV 50 W or 65 kV 100 W), large-area high-throughput SDD,
analyze Na to U
Software: QuantEZ for control of spectrometer functions and data analysis
Options: Vacuum, helium purge, automatic sample changers, sample spinner tray, external
PC with Microsoft Windows operating system, UPS, RPF-SQX Fundamental
Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11
compliance, other software features
Dimensions: 46.3 (W) x 49.2 (D) x 38.2 (H) cm
Mass: Approx. 65 kg (NEX CG II); approx. 68 kg (NEX CG II+)
Power requirements: 1Ø, 100 – 240 V, 3.8 – 1.6 A (50/60 Hz) or 100 – 240 V, 5.2 – 2.6 A (50/60 Hz)