X-ray Fluorescence – Guill-Bern Corporation https://guill-bern.com.ph Mon, 03 Mar 2025 03:09:15 +0000 en-US hourly 1 https://wordpress.org/?v=7.0 https://guill-bern.com.ph/wp-content/uploads/2024/08/cropped-android-chrome-512x512-1-2-32x32.webp X-ray Fluorescence – Guill-Bern Corporation https://guill-bern.com.ph 32 32 Micro-Z ULS https://guill-bern.com.ph/product/micro-z-uls/ Wed, 28 Aug 2024 01:43:25 +0000 https://guill-bern.com.ph/?post_type=product&p=2460 WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SULFUR (S) ANALYZER

Designed for ultra-low level sulfur analysis of diesel, petrol (gasoline) and other fuels, the Rigaku Micro-Z ULS wavelength dispersive X-ray fluorescence (WDXRF) instrument features a novel design that measures both the sulfur peak and the back-ground intensity. The ability to measure and correct for changes in background intensity delivers a better net peak intensity measurement, resulting in superior calibrations and enhanced real-world precision. Rigaku Micro-Z ULS complies with ASTM 2622-10, ISO 20884 and JIS K2541-7 methods

]]> Supermini200 https://guill-bern.com.ph/product/supermini200/ Wed, 28 Aug 2024 01:41:14 +0000 https://guill-bern.com.ph/?post_type=product&p=2459 HIGH-POWER BENCHTOP SEQUENTIAL WDXRF SPECTROMETER

Elemental analysis of oxygen to uranium

Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high-resolution instrument with a compact footprint. As a high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, for elemental analysis of oxygen (O) through uranium (U) in almost any material, the Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).

]]> NEX CG II Series https://guill-bern.com.ph/product/nex-cg-ii/ Wed, 28 Aug 2024 01:21:34 +0000 https://guill-bern.com.ph/?post_type=product&p=2449 The Rigaku NEX CG II Series are powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers. They perform rapid qualitative and quantitative elemental
analyses and address needs across many industries. NEX CG II Series spectrometers serve a broad
range of applications and are ideal for measuring ultra-low and trace element concentrations up to
percent levels.
Unlike conventional EDXRF spectrometers, NEX CG II Series are indirect excitation systems using
secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary
targets vastly improves detection limits for elements in highly scattering matrices like water,
hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry
eliminates background noise. As a result, the NEX CG II Series spectrometers bring a new level of
analytical sensitivity to XRF technology. Users can measure ultra-low and trace element
concentrations, even in challenging sample types.
Models include NEX CG II for excellent spectral resolution for trace peaks or NEX CG II+ for more
demanding applications requiring a higher-powered system.

NEX CG II Series spectrometers are well suited for the following applications:
• Agricultural soil and plant materials
• Finished animal feeds
• Waste oils
• Environmental monitoring
• Pharmaceuticals and cosmetics
• Catalysts
• Monitoring for toxic metals in aerosols on air filters
• Trace heavy metals and rare earth elements (REE)
• Other applications that require a high degree of sensitivity

 

NEX CG II Series – Key Advantages and Features
• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Quick elemental analyses of solids, liquids, powders, coatings, and thin films
• Indirect excitation for exceptionally low detection limits
• High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
• Large-area high-throughput silicon drift detector (SDD)
• Analysis in air, helium, or vacuum
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
• Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
• SureDI support for 21 CFR Part 11 compliance
• Various automatic sample changers accommodating up to 52 mm samples
• Low cost of ownership

 

NEX CG II Series – Specifications
Technique: Indirect excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit: Excel in complex applications with trace elements and variable base matrices;
analyze solids, liquids, powders, coatings, and thin films
Technology: 3D Cartesian geometry energy dispersive XRF (EDXRF) using a large-area high
throughput silicon drift detector (SDD)
Attributes: High-power X-ray tube (50 kV 50 W or 65 kV 100 W), large-area high-throughput SDD,
analyze Na to U
Software: QuantEZ for control of spectrometer functions and data analysis
Options: Vacuum, helium purge, automatic sample changers, sample spinner tray, external
PC with Microsoft Windows operating system, UPS, RPF-SQX Fundamental
Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11
compliance, other software features
Dimensions: 46.3 (W) x 49.2 (D) x 38.2 (H) cm
Mass: Approx. 65 kg (NEX CG II); approx. 68 kg (NEX CG II+)
Power requirements: 1Ø, 100 – 240 V, 3.8 – 1.6 A (50/60 Hz) or 100 – 240 V, 5.2 – 2.6 A (50/60 Hz)

]]>