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NEX DE Series
60 kV EDXRF for high-performance results when analysis time or sample throughput is critical or
when small spot analysis is required
NEX DE Series elemental analyzers deliver high-performance results when analysis time or sample
throughput is critical. These instruments provide expanded analytical capabilities, including higher
sample batch throughput, small spot analysis, or enhanced performance for measurement of
higher atomic number elements.
The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray
fluorescence (EDXRF) spectrometers. These instruments provide rapid, non-destructive elemental
analysis of sodium to uranium in almost any sample type.
NEX DE Series spectrometers have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a
high-throughput silicon drift detector (SDD) that supports count rates over 500K cps. The high
count rates deliver low limits of detection and provide excellent spectral resolution. Combined with
the powerful QuantEZ software, these features provide unparalleled performance.
For applications requiring small spot analysis, the NEX DE VS model offers a high-resolution
camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3
mm, and 10 mm spot sizes.
Whether the need is basic quality control (QC) or its more sophisticated variants such as analytical
quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma — NEX DE
Series spectrometers deliver quick, high-performance results without complex setups.
Models include NEX DE and NEX DE VS.
NEX DE Series – Key Advantages and Features
• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Solids, liquids, alloys, powders and thin films
• High-performance SDD for superior data
• Unmatched performance-to-price ratio
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• 60 kV X-ray tube for wide elemental coverage
• Multiple automated tube filters for enhanced sensitivity
• Advanced RPF-SQX Fundamental Parameters software featuring Rigaku Scattering FP
• SureDI support for 21 CFR Part 11 compliance
• High-res camera and automated collimators for accurate sample positioning (NEX DE VS)
• Analyze 1 mm, 3 mm, and 10 mm spot sizes (NEX DE VS)
NEX DE Series – Specifications
Technique: Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit:High-performance results when analysis time or sample throughput is critical; analyze solids, liquids, powders, coatings, and thin films
Integrated camera and small spot analysis (NEX DE VS model)
Technology: Energy dispersive XRF (EDXRF) using high-performance silicon drift detector (SDD)
Attributes: 60 kV 12 W X-ray tube with automated tube filters, high-performance SDD, analyze
Na to U
Software: QuantEZ for control of spectrometer functions and data analysis
Options: Vacuum (NEX DE model), helium purge, automatic sample changers, single
position sample spinner, external PC with Microsoft® Windows® operating system,
UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support
for 21 CFR Part 11 compliance, other software features
Dimensions: 356 (W) x 260 (H) x 351 (D) mm
Mass: Approx. 27 kg (core unit)
Power requirements: 1Ø, 100 – 240 V, 1.5 A (50/60 Hz)
